Measurements:
- S, Y, H, or Z parameters in tabular or graphical form.
- Magnitude, Angle, VSWR, Noise Figure, Stability Factor, Maximum Available Gain, Noise Impedance or Admittance, Noise Reflection, dB, Real, Imaginary, Maximum Stable Gain, FETMODEL, 1 to 20 port output data.
- User-defined measurements calculated and displayed.
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Data Acquisition:
The MMICAD Linear Simulator interfaces directly with Anritsu and HP Vector Network Analyzers to allow S-parameter acquisition.
The data acquisition capabilities of the MMICAD Version 3 simulator allow measured S-parameters to be stored on disk or used directly in a real-time MMICAD linear circuit simulation. Standard features include: test jig de-embedding, time-delayed data acquisition using, for example, IEEE-488 controlled ovens for temperature control; automatic acquisition as a function of bias, with storage in auto-incrementing files, and facilities for device traceability. |
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Operating Modes:
MMICAD Version 3 supports the following operating modes:
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- Analysis Mode:
Simulates circuits as a function of frequency. - Error Function Mode:
Plots the circuit optimization error function as a function of parametric variation.
- Variational Analysis Mode:
Sweeps a parameter as a function of frequency over a specified range.
- Parameter Mode:
Simulates circuit as a function of some parameter (e.g. component value, bias point, transistor size, etc.)
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- Optimization Mode:
Optimizes circuits to meet predefined goals.
- Tune Mode:
Manually vary a circuit element.
- Yield Analysis Mode:
Determine the circuit manufacturing yield.
- Yield Sensitivity Analysis Mode:
Determines the influence of circuit variables on manufacturing yield.
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Backwards compatibility is maintained with the MMICAD Version 2 netlist format. Version 2 circuit files can be imported into Version 3. Separately, circuit files generated using Version 3 can be exported to Version 2. The import/export capabilities of Version 2 are retained (e.g. Touchstone® and PSPICE® file import and export.)
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