Computer Aided Testing:


MMICAD has extensive test equipment control and data acquisition features including: real-time S-parameter acquisition for use in circuit simulation; source control; test jig de-embedding; time-delayed data acquisition; automatic acquisition as a function of bias with storage into auto-incrementing data files; facilities for device traceability and documentation.



Network Analyzer Interface:

  • Support for the HP8700, HP8510, Anritsu 360 and Anritsu 37000 series.
  • Built-in IEEE-488 control in the circuit file allowing for stimulus and response measurements (power supply conrol).
  • Network de-embedding. Results can be plotted as a function of data file variations (e.g. bias).
  • Results can be stored in CITI file format.

Database Sampling:

The MMICAD Linear Simulator can read standard S-parameter data as a function of either frequency or some other parameter, i.e. bias. Also, input can be in the form of arbitrary, columnar-formatted ASCII data. For example, the equivalent circuit of a MESFET as a function of gate bias can be read into circuit variables. This unique feature is termed "Database Sampling". Either all, or individual, rows of the data can be selected during circuit and yield analysis. In the MESFET example, this implies that MMICAD can determine the optimal transistor bias point in an amplifier simulation using Database Sampling and real, measured equivalent circuit data. (This data could originate, for example, from process control monitor measurements.)