DATA ACQUISITION AND MODELING
The data acquisition capabilities of the MMICAD Version 3 Linear Simulator allow measured S-parameters to be stored on disk or used directly in a real-time MMICAD circuit simulation. Standard features include: test jig de-embedding; time-delayed data acquisition using, for example, IEEE-488 controlled ovens for temperature control; automatic acquisition as a function of bias, with storage in auto-incrementing files and facilities for device traceability.
Accurate small signal design requires the use of precise device models. The development of these models is time-consuming and expensive. Whenever possible, designers prefer to use measured data directly in the circuit simulation.
The MMICAD Version 3 Linear Simulator addresses this requirement by interfacing directly with Anritsu or HP vector network analyzers to allow real-time or time-delayed S-parameter acquisition as a function of single bias variation.
Two MMICAD suite components further assist the designer in using measured data in simulation and modeling:
